On the afternoon of 18 June, the Faculty of Electronics and Telecommunications (FETEL) at VNUHCM-University of Science hosted a seminar entitled “General Electronics Measurement Solution (GEMS)” at the Nguyen Van Cu campus.

The seminar was attended by Assoc. Prof. Trần Văn Mẫn, Head of the Office of Science and Technology, and Dr. Bùi Trọng Tú, Dean of FETEL, along with lecturers and students from FETEL. The event featured two guest speakers: Mr. Ken Yong Lee, Business Development Manager of GEMS at Keysight Technologies, and Mr. Lê Đắc Tâm, Sales Account Manager at ASIC Technologies.

Keysight Technologies, Inc., formerly known as HP Agilent Technologies, is a global American corporation that provides solutions for the design, simulation, and testing of electronic devices across various industries. This includes aerospace, defence, automotive, telecommunications, education, energy, finance, government, healthcare, IT, manufacturing, retail, semiconductor, and software. ASIC Technologies, the official distributor of Keysight Technologies, Inc., specialises in offering electronic measurement products, antenna measurement tools, system design tools, high-frequency design, electronic circuit design, software, electronic circuit manufacturing solutions, high-frequency circuits, and other products.

During the seminar, Mr. Ken Yong Lee presented valuable information regarding the General Electronics Measurement Solution (GEMS) and its applications across different industries. He also discussed the five main development directions for the IoT ecosystem. Predictions indicated that by 2030, there would be approximately 125 billion connected devices due to the rapid growth of IoT, which would create a demand for new measurement solutions and advancements in wireless connectivity.

Other topics covered included the IoT Over-the-Air (OTA) test solution for testing multiple Devices Under Test (DUT) simultaneously without the need for test ports; seamless IoT testing during the design and production phases; measurement standards from various countries and the necessary standards when manufacturing IoT devices to meet FCC and ETSI criteria; as well as the IoT0047A test solution for unlicensed wireless IoT devices.

These compelling topics attracted active participation and interest during the discussion and Q&A session from lecturers and students at FETEL, as well as students from other faculties who were keen to learn more.

Acronyms:
IoT: Internet of Things;
DUT: Device Under Test;
FCC: Federal Communications Commission;
ETSI: European Telecommunications Standards Institute.