SEMINAR: ‘GEMS – GENERAL ELECTRONICS MEASUREMENT SOLUTION’

SEMINAR: ‘GEMS – GENERAL ELECTRONICS MEASUREMENT SOLUTION’

On the afternoon of June 18, the Faculty of Electronics – Telecommunications (FETEL) of VNUHCM-University of Science hosted a seminar entitled “General Electronics Measurement Solution (GEMS)” at their Nguyen Van Cu campus.

Attending the seminar were Assoc. Prof. Trần Văn Mẫn, Head of the Office of Science and Technology, and Dr. Bùi Trọng Tú, Dean of FETEL, along with lecturers and students from FETEL. The seminar featured two guest speakers: Mr. Ken Yong Lee, Business Development Manager of GEMS at Keysight Technologies, and Mr. Lê Đắc Tâm, Sales Account Manager of Asic Technologies.

Keysight Technologies, Inc., previously known as HP Agilent Technologies, is a global American corporation that provides conditions for designing, simulating, and testing electronic devices for various industries, including aerospace, defence, automotive, telecommunications, education, energy, finance, government, healthcare, IT, manufacturing, retail, semiconductor, and software. ASIC Technologies, the official distributor of Keysight Technologies, Inc., specialises in providing electronic measurement products, antenna measurement tools, system design tools, high-frequency design, electronic circuit design, software, electronic circuit manufacturing solutions, high-frequency circuits, and other products.

During the seminar, Mr. Ken Yong Lee presented valuable information about the General Electronics Measurement Solution (GEMS) and its applications across various industries. He also discussed the five main development directions for the IoT ecosystem. Predictions suggest that by 2030, there will be approximately 125 billion connected devices due to the rapid growth of IoT, creating a demand for new measurement solutions and the advancement of wireless connectivity.

Other topics discussed included the IoT Over-the-Air (OTA) test solution for testing multiple DUT devices simultaneously without the need for test ports; seamless IoT testing during design and production; measurement standards of countries and necessary standards when manufacturing IoT devices to meet FCC and ETSI criteria; and the IoT0047A test solution for unlicensed wireless IoT devices.

These compelling topics attracted active participation and interest in the discussion and Q&A session from lecturers and students from FETEL, as well as students from other faculties who were interested.

 

*Acronyms:
IoT: Internet of Things;
DUT: Device Under Test;
FCC:  Federal Communications Commission;
ETSI: European Telecommunications Standards Institute.

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